Skip to main content

Horizontal Menu

  • Research
    • Areas
    • Projects
    • Publications
    • NSA Center of Academic Excellence
  • Education
    • Prospective Students
    • Summer Program Info
  • Team
  • Sponsors
  • Contact
  • Opportunities
  • Intranet
    • Intranet
    • JIRA
    • Proposal Questionnaire
    • Change Password

Hamburger Menu

  • Home
  • ISIS Calendar
    • Research Projects
    • Research Areas
    • Publications
    • Grad Student Info
    • Internship Program
    • Prospective Students
  • Team
  • Sponsors
  • Contact
  • Opportunities
    • Announcements
    • ISIS Intranet
    • ISIS JIRA
    • Proposal Questionnaire
    • Change Password

Breadcrumb

  • Home /
  • M.R. Myers
First name
M.R.
Last name
Myers
Myers, M., Jorge, A., Mutton, M., & Walker, D. (2012). A comparison of extended Kalman filter, ultrasound time-of-flight measurement models for heating source localization. Inverse Problems in Science and Engineering, 1–26. (Original work published April 2012)
View
Myers, M., Jorge, A., Mutton, M., & Walker, D. (2012). An Adaptive Extended Kalman Filter for Localizing a High Heat Flux Point Source Using an Ultrasonic Sensor Array. Computer Modeling in Engineering and Sciences, 83, 27.
View
Myers, M., Jorge, A., Mutton, M., & Walker, D. (2012). A comparison of extended Kalman filter, particle filter, and least squares localization methods for a high heat flux concentrated source. International Journal of Heat and Mass Transfer, 55(9-10), 2219–2228. (Original work published April 2012)
View
Myers, M., Jorge, A., Mutton, M., & Walker, D. (2012). High heat flux point source sensitivity and localization analysis for an ultrasonic sensor array. International Journal of Heat and Mass Transfer, 55(9-10), 2472–2485. (Original work published April 2012)
View

Footer Links A

  • About Us
  • Contact
  • LinkedIn

Footer Links B

  • Work at the Institute
  • Summer Program Info
  • Grad Student Info

1025 16th Avenue South

Nashville, Tennessee 37212

Phone: (615) 343-7472

Email: contact.isis at vanderbilt dot edu